Propagation loss in a silicon waveguide

Description

Calculated propagation loss in a silicon waveguide (λ = 1.55 μm, n_core = 3.4765, n_clad = 1) as a function of waveguide width at fixed surface roughness (σ = 250 nm), for varying sidewall correlation lengths (L_c = 100, 300, 600, 1000, 1500 nm). Loss decreases rapidly with increasing width, transitioning from multimode to single-mode regimes, with longer correlation lengths yielding lower losses due to reduced scattering efficiency. The logarithmic scale highlights the strong inverse dependence on width, emphasizing the importance of precise fabrication for low-loss photonics.

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